Microscopy atomic force

microscopy, atomic force

microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. A microcomputer keeps track of the vertical excursions as a function of the position of the probe in the horizontal plane and presents the sample's image.

Retrieved from "http://www.biology-online.org/bodict/index.php?title=Microscopy_atomic_force&oldid=57866"
First | Previous (Microscopy) | Next (Microscopy confocal) | Last
Please contribute to this project, if you have more information about this term feel free to edit this page.