We examined fragments of rock chip ,270 (parent ,221) from the meteorite ALH84001. Specimens were either embedded in resin, cut with a diamond saw, ground, polished, and coated with 10 nm of carbon or fractured and coated without embedding. For SEM-BSE and SEM-SE imaging the following microscopes were used: tungsten-filament Zeiss DSM940A (Fig. 3 A, D, and E), field emission Zeiss Gemini 982 (Fig. 3 B, C, and F and Fig. 4C), Philips EFEGXL20 (Fig. 1C), and LEO 1525 (Fig. 1 A, B, and D-L and Fig. 4 A and B). The fuzziness of images was reduced by an analySIS (Soft Imaging System, Münster, Germany) DCE (differential contrast enhancement) filter. Energy-dispersive x-ray spectroscopy microanalysis was performed with a Link ISIS Oxford and a Kevex 8000 Quantum system and for Fig. 4B with an IXRF system. Auger electron spectroscopy was done in a PHI model 670 scanning Auger microscope (Physical Electronics, Eden Prairie, MN) equipped with a Schottky FE electron gun. Stereo micrograph pairs were tilted at 7°.